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ANFIS-based Approach to Predict the Degradation-related Ageing of Junctionless GAA MOSFET
Chebaki, Elasaad, Djeffal, Fayçal, Bentrcia, ToufikVolume:
5
Year:
2018
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2018.05.038
File:
PDF, 981 KB
2018