Investigation of the Capacitance–Voltage Electrical Characteristics of Thin-film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
Chen, Hong-Chih, Kuo, Chuan-Wei, Chang, Ting-Chang, Lai, Wei-Chih, Chen, Po-Hsun, Chen, Guan-Fu, Huang, Shin-Ping, Chen, Jian-Jie, Zhou, Kuan-Ju, Shih, Chih-Cheng, Tsao, Yu-Ching, Huang, Hui-Chun, SzeJournal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.9b11637
Date:
October, 2019
File:
PDF, 1.43 MB
2019