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[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Reliability Studies of Silicon Interconnect Fabric
Shakoorzadeh, Niloofar, Jangam, Siva Chandra, Rahim, Kaysar, Ambhore, Pranav, Chien, Han, Hanna, Amir, Iyer, Subramanian S.Year:
2019
DOI:
10.1109/ECTC.2019.00126
File:
PDF, 1.94 MB
2019