[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Application Specific True Critical Paths Identification in Sequential Circuits
Jurimagi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan, Devadze, Sergei, Oyeniran, Adeboye StephenYear:
2019
DOI:
10.1109/IOLTS.2019.8854442
File:
PDF, 302 KB
2019