Analysis of 80 MeV Carbon and 80 MeV Nitrogen ion irradiation effects on N-channel MOSFETs
Anjum, Arshiya, Pradeep, T. M., Vinayakprasanna, N. H., Pushpa, N., Tripathi, Ambuj, Prakash, A. P. GnanaYear:
2019
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2945400
File:
PDF, 1.11 MB
2019