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Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy
Matsuki, Nobuyuki, Ishihara, Ryoichi, Beenakker, KeesVolume:
25
Language:
english
Journal:
Information Display
DOI:
10.1002/j.2637-496x.2009.tb00078.x
Date:
March, 2009
File:
PDF, 264 KB
english, 2009