Analysis of the electrical impedance spectroscopy...

Superlattices and Microstructures 2019 / 10

Analysis of the electrical impedance spectroscopy measurements of ZnTe:Ni thin film deposited by R-F sputtering

Chaik, M., Ben Moumen, S., Bouferra, R., A.Outzourhit,, Essaleh, L.
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Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2019.106319
Date:
October, 2019
File:
PDF, 820 KB
english, 2019
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