Voltammetric and X-ray diffraction analysis of the early...

Journal of Solid State Electrochemistry 2004 / 03 Vol. 8; Iss. 4

Voltammetric and X-ray diffraction analysis of the early stages of the thermal crystallization of mixed Cu,Mn oxides

T. Grygar, T. Rojka, P. Bezdička, E. Večerníková, F. Kovanda
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Pages:
8
DOI:
10.1007/s10008-003-0439-z
Date:
March, 2004
File:
PDF, 346 KB
english, 2004
Conversion to is in progress
Conversion to is failed