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Diffraction paradox: An unusually broad diffraction background marks high quality graphene
Chen, S., Horn von Hoegen, M., Thiel, P. A., Tringides, M. C.Volume:
100
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.100.155307
Date:
October, 2019
File:
PDF, 1.20 MB
english, 2019