[IEEE 2018 IEEE Conference on Visual Analytics Science and...

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[IEEE 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - Berlin, Germany (2018.10.21-2018.10.26)] 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - Audio Explorer - VAST Challenge 2018 MC1 (Awarded “Excellent Comprehensive Submission”)

Scruggs, Colin, Henkel, Cameron, Stolper, Charles D.
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Year:
2018
Language:
english
DOI:
10.1109/vast.2018.8802399
File:
PDF, 164 KB
english, 2018
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