[IEEE 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - Berlin, Germany (2018.10.21-2018.10.26)] 2018 IEEE Conference on Visual Analytics Science and Technology (VAST) - Audio Explorer - VAST Challenge 2018 MC1 (Awarded “Excellent Comprehensive Submission”)
Scruggs, Colin, Henkel, Cameron, Stolper, Charles D.Year:
2018
Language:
english
DOI:
10.1109/vast.2018.8802399
File:
PDF, 164 KB
english, 2018