[IEEE 2019 IEEE 9th International Nanoelectronics Conferences (INEC) - Kuching, Malaysia (2019.7.3-2019.7.5)] 2019 IEEE 9th International Nanoelectronics Conferences (INEC) - Effective Defect Screening of Integrated Large HV LDMOS Driver in Critical Automotive Application towards “Zero Defects”
Bolhan, Nur Izyan, Liew, Madelyn, Lim, Lydia, Sim, Poh Ching, Yang, Hao, Holke, AlexanderYear:
2019
Language:
english
DOI:
10.1109/INEC.2019.8853851
File:
PDF, 953 KB
english, 2019