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Automatic Seal Imprint Verification Systems Using Edge Difference
Su, Yu-Chen, Ueng, Yeong-Luh, Chung, Wei-HoVolume:
7
Year:
2019
Language:
english
Journal:
IEEE Access
DOI:
10.1109/access.2019.2945045
File:
PDF, 1.05 MB
english, 2019