Fault-Tolerant Architecture for Reliable Integrated Gate...

IEEE Journal of the Electron Devices Society 2019 Vol. 7

Fault-Tolerant Architecture for Reliable Integrated Gate Drivers

Kim, Jongbin, Chung, Hoon-Ju, Lee, Seung-Woo
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Volume:
7
Year:
2019
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2019.2943542
File:
PDF, 8.27 MB
english, 2019
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