Study of Nitrogen Doping Effect on Lattice Strain Variation in 4H-SiC Substrates by Synchrotron X-Ray Contour Mapping Method
Ailihumaer, Tuerxun, Yang, Yu, Guo, Jian Qiu, Raghothamachar, Balaji, Dudley, MichaelVolume:
963
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.963.336
Date:
July, 2019
File:
PDF, 2.80 MB
english, 2019