44.4: Invited Paper: Study on...

SID Symposium Digest of Technical Papers 2019 / 09 Vol. 50; Iss. S1

44.4: Invited Paper: Study on the Degradation Mechanisms of Quantum‐Dot Light‐Emitting Diodes

Chen, Song, Cao, Weiran, Liu, Taili, Tsang, Sai-Wing, Yang, Yixing, Yan, Xiaolin, Qian, Lei
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Volume:
50
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.13539
Date:
September, 2019
File:
PDF, 201 KB
2019
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