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[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Stuck-at-OFF Fault Analysis in Memristor-Based Architecture for Synchronization
Escudero, Manuel, Vourkas, Ioannis, Rubio, AntonioYear:
2019
DOI:
10.1109/iolts.2019.8854413
File:
PDF, 283 KB
2019