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In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials
Kempshall, B.W., Giannuzzi, L.A.Volume:
8
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927602100717
Date:
August, 2002
File:
PDF, 841 KB
2002