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Microsystem Technologies 2019 / 7

Contamination assessment of insulators using microsystem technology with fuzzy-based approach

Wang, Yi-Che, Lin, Yen-Ting, Chang, Hong-Chan, Kuo, Cheng-Chien
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Language:
english
Journal:
Microsystem Technologies
DOI:
10.1007/s00542-019-04538-5
Date:
July, 2019
File:
PDF, 12.02 MB
english, 2019
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