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System for measuring optical admittance of a thin film stack
Sheng-Hui Chen, Kai Wu, Chien-Cheng Kuo, Sheng-Ju Ma, Cheng-Chung LeeVolume:
16
Language:
english
Pages:
4
DOI:
10.1007/s10043-009-0093-5
Date:
July, 2009
File:
PDF, 207 KB
english, 2009