Effective defect detection in thin film transistor liquid crystal display images using adaptive multi-level defect detection and probability density function
Se-Yun Kim, Young-Chul Song, Chang-Do Jung, Kil-Houm ParkVolume:
18
Language:
english
Pages:
6
DOI:
10.1007/s10043-011-0041-z
Date:
March, 2011
File:
PDF, 1009 KB
english, 2011