Application of piecewise linear regression twice to inspect the defective regions on thin film transistor liquid crystal display panels
Chang-Do Jung, Hyunduk Kim, Se-Yun Kim, Yongdo Lim, Kil-Houm ParkVolume:
18
Language:
english
Pages:
6
DOI:
10.1007/s10043-011-0067-2
Date:
July, 2011
File:
PDF, 1.06 MB
english, 2011