Fast Algorithm Based on Projection and Normalized Cross Correlation for Embossing Flaws Detection
Kong, Honghong, Sun, Jian, Zhong, Shaojun, Xie, Min, Fu, YaqiongVolume:
13
Journal:
Energy Procedia
DOI:
10.1016/j.egypro.2011.12.680
Date:
January, 2011
File:
PDF, 8 KB
2011