Comparison of Single-Event Transients in SiGe HBTs on Bulk...

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IEEE Transactions on Nuclear Science 2019

Comparison of Single-Event Transients in SiGe HBTs on Bulk and Thick-Film SOI

Ildefonso, Adrian, Warner, Jeffrey H., Cressler, John D., Tzintzarov, George N., Nergui, Delgermaa, Omprakash, Anup P., Goley, Patrick S., Hales, Joel M., Khachatrian, Ani, Buchner, Stephen P., McMorr
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2019.2950864
File:
PDF, 1.55 MB
english, 2019
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