[IEEE 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Udine, Italy (2019.9.4-2019.9.6)] 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Quantum Transport Simulations of the Zero Temperature Coefficient in Gate-all-around Nanowire pFETs
Lee, Hyeongu, Seo, Junbeom, Shin, MincheolYear:
2019
DOI:
10.1109/sispad.2019.8870416
File:
PDF, 720 KB
2019