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Preparation and analysis of strain-free uranium surfaces for electron and x-ray diffraction analysis
Sutcliffe, J.E., Petherbridge, J.R., Cartwright, T., Springell, R., Scott, T.B., Darnbrough, J.E.Language:
english
Journal:
Materials Characterization
DOI:
10.1016/j.matchar.2019.109968
Date:
October, 2019
File:
PDF, 2.13 MB
english, 2019