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Film-nanostructure-controlled inerasable-to-erasable switching transition in ZnO-based transparent memristor devices: sputtering pressure dependency
Simanjuntak, Firman Mangasa, Ohno, Takeo, Samukawa, SeijiLanguage:
english
Journal:
ACS Applied Electronic Materials
DOI:
10.1021/acsaelm.9b00617
Date:
October, 2019
File:
PDF, 13.92 MB
english, 2019