[IEEE 2019 IEEE International Test Conference in Asia...

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[IEEE 2019 IEEE International Test Conference in Asia (ITC-Asia) - Tokyo, Japan (2019.9.3-2019.9.5)] 2019 IEEE International Test Conference in Asia (ITC-Asia) - An Empirical Approach to RTL Scan Path Design Focusing on Structural Interpretation in Logic Synthesis

Iwagaki, Tsuyoshi, Yuasa, Sho, Ichihara, Hideyuki, Inoue, Tomoo
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Year:
2019
Language:
english
DOI:
10.1109/itc-asia.2019.00023
File:
PDF, 227 KB
english, 2019
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