Do different cross‐project defect prediction methods identify the same defective modules?
Chen, Xiang, Mu, Yanzhou, Qu, Yubin, Ni, Chao, Liu, Meng, He, Tong, Liu, ShangqingLanguage:
english
Journal:
Journal of Software: Evolution and Process
DOI:
10.1002/smr.2234
Date:
October, 2019
File:
PDF, 2.48 MB
english, 2019