![](/img/cover-not-exists.png)
Orientation mapping with Kikuchi patterns generated from a focused STEM probe and indexing with commercially available EDAX software
Burton, George L., Wright, Stuart, Stokes, Adam, Diercks, David R., Clarke, Amy, Gorman, Brian P.Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112882
Date:
November, 2019
File:
PDF, 1.93 MB
english, 2019