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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - High Performance Low Leakage Pocket Si x Ge 1-x Junction-Less Single-Gate Tunnel FET for 10 nm Technology
Tripathi, Suman Lata, Sinha, Sanjeet Kumar, Patel, Govind Singh, Awasthi, SandhyaYear:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770480
File:
PDF, 590 KB
english, 2018