Near Threshold Capacitance Matching in a Negative Capacitance FET with 1 nm Effective Oxide Thickness Gate Stack
Kwon, Daewoong, Cheema, Suraj, Lin, Yen-Kai, Liao, Yu-Hung, Chatterjee, Korok, Tan, Ava J., Hu, Chenming, Salahuddin, SayeefYear:
2019
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2951705
File:
PDF, 2.33 MB
english, 2019
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