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[IEEE 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS) - Seoul, Korea (South) (2019.1.27-2019.1.31)] 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS) - NIR and MIR Absorption of Ultra-Black Silicon (UBS). Application to High Emissivity, All-Silicon, Light Source
Sarkar, Sreyash, Elsayed, Ahmed A., Nefzaoui, Elyes, Drevillon, Jeremie, Basset, Philippe, Marty, Frederic, Anwar, Momen, Yu, Yiting, Zhao, Jiancun, Yuan, Xichen, Liang, ZhongZhu, Khalil, Diaa, Sabry,Year:
2019
Language:
english
DOI:
10.1109/memsys.2019.8870641
File:
PDF, 1.76 MB
english, 2019