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[IEEE 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Udine, Italy (2019.9.4-2019.9.6)] 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - OFF Current Suppression by Gate-gontrolled Strain in The N-type GaAs Piezoelectric FinFETs
Long, Yuxiong, Huang, Jun Z., Wei, Zhongming, Luo, Jun-Wei, Jiang, XiangweiYear:
2019
DOI:
10.1109/sispad.2019.8870452
File:
PDF, 139 KB
2019