![](/img/cover-not-exists.png)
[IEEE 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Udine, Italy (2019.9.4-2019.9.6)] 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Multiscale Modeling of Charge Trapping in Molecule Based Flash Memories
Badami, Oves, Sadi, Toufik, Georgiev, Vihar, Adamu-Lema, Fikru, Thirunavukkarasu, Vasanthan, Ding, Jie, Asenov, AsenYear:
2019
Language:
english
DOI:
10.1109/sispad.2019.8870518
File:
PDF, 1.30 MB
english, 2019