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[IEEE 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Udine, Italy (2019.9.4-2019.9.6)] 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - A Stochastic Hole Trapping-Detrapping Framework for NBTI, TDDS and RTN
Bhagdikar, Sharang, Mahapatra, SouvikYear:
2019
Language:
english
DOI:
10.1109/sispad.2019.8870524
File:
PDF, 6.05 MB
english, 2019