Comparison of Transmission Electron Microscopy and X-Ray...

Crystallography Reports 2019 / 9 Vol. 64; Iss. 5

Comparison of Transmission Electron Microscopy and X-Ray Reflectometry Data in the Study of the Structure of Silicon-Carbon Nanocomposite Films

Asadchikov, V. E., Volkov, Y. O., Dyachkova, I. G., Zhigalina, O. M., Kanevsky, V. M., Muslimov, A. E., Nuzhdin, A. D., Pimenov, S. M., Roshchin, B. S., Rusakov, A. A., Khmelenin, D. N., Shahbazov, S.
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Volume:
64
Language:
english
Journal:
Crystallography Reports
DOI:
10.1134/S1063774519050031
Date:
September, 2019
File:
PDF, 684 KB
english, 2019
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