Quantitative thickness measurement of polarity-inverted...

Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy

Odagawa, Hiroyuki, Terada, Koshiro, Tanaka, Yohei, Nishikawa, Hiroaki, Yanagitani, Takahiko, Cho, Yasuo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.10PF18
Date:
October, 2017
File:
PDF, 695 KB
english, 2017
Conversion to is in progress
Conversion to is failed