[AIP 26th Annual review of progress in quantitative nondestrictive evaluation - Montreal (Canada) (25-30 July 1999)] AIP Conference Proceedings - Reconstruction of back surface profiles from scanned thermal line source data using neural networks
Winfree, William P.Volume:
509
Year:
2000
DOI:
10.1063/1.1306116
File:
PDF, 683 KB
2000