Swift heavy ions-induced degradation on the electrical characteristics of silicon NPN power transistors
Pradeep, T. M., Hegde, Vinayakaprasanna N., Pushpa, N., Tripathi, Ambuj, Asokan, K., Gnana Prakash, A. P.Volume:
174
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420150.2019.1667356
Date:
October, 2019
File:
PDF, 2.02 MB
english, 2019