Structural engineering of Li based electronic synapse for...

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IEEE Electron Device Letters 2019

Structural engineering of Li based electronic synapse for high reliability

Choi, Yunseok, Lee, Chuljun, Kim, Myungjun, Song, Yubin, Hwang, Hyunsang, Lee, Daeseok
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Year:
2019
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2950202
File:
PDF, 708 KB
english, 2019
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