A Device-to-System Perspective Regarding Self-Heating...

IEEE Transactions on Electron Devices 2019 / 11 Vol. 66; Iss. 11

A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review

Alam, Muhammad Ashraful, Mahajan, Bikram Kishore, Chen, Yen-Pu, Ahn, Woojin, Jiang, Hai, Shin, Sang Hoon
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Volume:
66
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2941445
Date:
November, 2019
File:
PDF, 1.74 MB
english, 2019
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