[IEEE 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Riverside, CA, USA (2019.9.15-2019.9.20)] 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Discharge Current Analysis with Charged Connector Pins
Tamminen, Pasi, Fung, Rita, Wong, RickYear:
2019
Language:
english
DOI:
10.23919/EOS/ESD.2019.8869966
File:
PDF, 1.63 MB
english, 2019