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[IEEE 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Riverside, CA, USA (2019.9.15-2019.9.20)] 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Low-Leakage NMOS Clamps with Gate-Assisted Bipolar Triggering
Stockinger, MichaelYear:
2019
Language:
english
DOI:
10.23919/EOS/ESD.2019.8869969
File:
PDF, 2.33 MB
english, 2019