[IEEE 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Riverside, CA, USA (2019.9.15-2019.9.20)] 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - 3.3V ESD Clamp structure susceptibility towards Pseudo Latch Up in 22nm FDSOI
Mittal, Anurag, Bansal, Nitin, Loiseau, Alain, Ginawi, Ahmed, Liang, Wei, Yerragudi, Shameer BashaYear:
2019
Language:
english
DOI:
10.23919/EOS/ESD.2019.8869995
File:
PDF, 613 KB
english, 2019