A Temperature Independent Effect of Near-Interface Traps in...

Materials Science Forum 2019 / 7 Vol. 963

A Temperature Independent Effect of Near-Interface Traps in 4H-SiC MOS Capacitors

Pande, Peyush, Dimitrijev, Sima, Haasmann, Daniel, Moghadam, Hamid Amini, Tanner, Philip, Han, Ji Sheng
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Volume:
963
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.963.236
Date:
July, 2019
File:
PDF, 1.48 MB
english, 2019
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