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The Research of Reliability of CX-1B-5 Connectors Coupling in AIT process of spacecraft
Zhang, Wei, Wang, Dongmei, Zhao, Peirong, Xie, Xilong, Zuo, NaVolume:
563
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/563/3/032027
Date:
August, 2019
File:
PDF, 1.15 MB
english, 2019