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Device Screening Strategy for Balancing Short Circuit Behavior of Paralleling Silicon Carbide MOSFETs
Ke, Junji, Zhao, Zhibin, Zou, Qi, Peng, Jiaoyang, Chen, Zhong, Cui, XiangYear:
2019
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2949449
File:
PDF, 3.23 MB
english, 2019