A Wide-Range Variation-Resilient Physically Unclonable...

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IEEE Journal of Solid-State Circuits 2019

A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm

Liang, Zhen-Yu, Wei, Hao-Hsuan, Liu, Tsung-Te
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Year:
2019
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/jssc.2019.2942374
File:
PDF, 3.90 MB
english, 2019
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