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[AIP Third international stress workshop on stress-induced phenomena in metallization - Palo Alto, California (USA) (21-23 Jun 1995)] AIP Conference Proceedings - Line length effects on lifetime measurements and resistance saturation during electromigration testing
Filippi, R. G., Biery, G. A., Wachnik, R. A.Volume:
373
Year:
1996
Language:
english
DOI:
10.1063/1.50944
File:
PDF, 1.15 MB
english, 1996