Vesicular Migration of Copper-laden Intrauterine Device...

Journal of Minimally Invasive Gynecology 2018 / 11 Vol. 25; Iss. 7

Vesicular Migration of Copper-laden Intrauterine Device Causing Chronic Pelvic Pain

Ghayouri, S., Garg, N., Sisto, J., Pedroso, J.
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Volume:
25
Language:
english
Journal:
Journal of Minimally Invasive Gynecology
DOI:
10.1016/j.jmig.2018.09.518
Date:
November, 2018
File:
PDF, 630 KB
english, 2018
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